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  • American Institute of Physics (AIP)  (2)
  • 2000-2004  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 3475-3477 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Secondary electron yields depending on work function were measured for 30 species of metal in ultrahigh vacuum by electron and ion bombardment. Secondary electron yields induced by electrons at 10 keV increase with work function, while those by Ar+ ions at 3 keV decrease with increasing work function. The opposite dependencies of secondary electron yields on work function between electron and ion bombardment are discussed on the basis of the different mechanisms of secondary electron emission, i.e., kinetic and potential emission for electron and ion bombardment, respectively. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 2333-2335 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A simple and sensitive detection method of Xe(1s5) excited atoms in the vicinity of a discharge wall with laser-collision induced fluorescence (LCIF) produced by evanescent wave absorption is proposed. The signal to noise (S/N) ratio was 102. The hyperfine structure (hfs) in the Xe LCIF spectra induced by resonant absorption of Xe(1s5→2p6) was confirmed to be identical with the hfs in laser absorption spectra, although the detection point (xPD) on the discharge wall was chosen independently of the position of the EW absorption (xEW). The insignificantly large fluorescence, which appeared for incident light angles to a prism larger than 4.8°, is explained by the fact that the refracted light emerged in a plasma. The Xe(1s5) number density in a dc Xe discharge, although roughly estimated, on the tube wall between the electrodes is presented. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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