ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
The evolution and structure of graphene layers on 4H-SiC(0001) and the correspondinginterface are investigated by scanning tunneling microscopy (STM) and low energy electron diffraction(LEED). The surface is characterized by the so-called (6p3£6p3)R30± reconstruction, whosestructural properties are still unclear but at the same time are crucial for the controlled growth ofhomogeneous high-quality large-terrace graphene surfaces. We analyse the properties of three phasesin this reconstruction with periodicities (6p3£6p3)R30±, (6£6) and (5£5). Their LEED intensitiesstrongly depend on the surface preparation procedure applied. The graphitization process imprintsdistinct features in the STM images as well as in the LEED spectra. An easy and practicable determinationof the number of graphene layers is outlined by means of LEED intensities
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/20/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.600-603.563.pdf
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