ISSN:
1551-2916
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
High-resolution X-ray scanning diffractometry has been used to study the residual strain in Si3N4/Ni diffusion bonds. Bonds were made by directly joining Ni and Si3N4 samples of same geometry by applying high temperature and enough mechanical pressure. The axial and radial strain profiles have been determined by X-ray diffraction in the ceramic bodies along selected lines perpendicular to the bonding interface. A very small absorption was assured as the X-ray experiments have been performed at the energy of 60 keV, which allowed measurements of the strain and stress fields in the ceramic bulk. The finite-element method calculations carried out showed an excellent agreement with the experimental data.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1551-2916.2005.00485.x
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