Publication Date:
2011-07-01
Description:
Author(s): D. Ziegler, P. Gava, J. Güttinger, F. Molitor, L. Wirtz, M. Lazzeri, A. M. Saitta, A. Stemmer, F. Mauri, and C. Stampfer We present Kelvin probe force microscopy measurements of single- and few-layer graphene resting on SiO 2 substrates. We compare the layer thickness dependency of the measured surface potential with ab initio density functional theory calculations of the work function for substrate-doped graphene. The... [Phys. Rev. B 83, 235434] Published Thu Jun 30, 2011
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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