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  • Polymer and Materials Science  (3)
  • Analytical Chemistry and Spectroscopy  (1)
  • 1990-1994  (4)
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  • 1
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A general expression for the energy and angular distribution of Auger/photoelectrons emitted from a specimen with an arbitrary depth profile is presented. The central quantities in this expression are the so-called partial escape distributions, which describe the probability that a signal electron generated in a certain depth interval escapes from the surface with a direction in a certain angular interval after experiencing a certain number of inelastic scattering processes. The partial escape distributions accounting for elastic scattering are calculated in the transport approximation. Comparison of analytical calculations with Monte Carlo data based on the more relastic Mott crosssection for elastic scattering yields excellent agreement. As an illustration of the general approach, the energy/angular spectrum of a sample with a model depth profile has been evaluated using analytical calculations and Monte Carlo data. The results obtained show that the proposed formalism properly accounts for elastic and inelastic processes and correctly predicts the shape of the energy distribution in the vicinity of the peak. It is, moreover, shown that the true intrinsic spectrum and depth profile may be reconstructed simultaneously from the measured energy/angular distribution of emitted electrons.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Reflection electron energy loss spectroscopy (REELS) spectra for Al, Ni, Pt and Au were measured in the energy range 300-1500 eV for different scattering geometries. The energy dependence of the loss spectra was found to depend strongly on the shape and the magnitude of the elastic scattering cross-section. This effect is extremely pronounced in the angle-resolved spectra, but also persists in the angle-integrated case. It was moreover observed that the relative intensities of the surface excitations in REELS spectra exhibit a similar dependence on the elastic scattering properties. These experimental observations are in good agreement with MC calculations accounting for elastic scattering through the differential Mott cross-section and demonstrate that quantitative information regarding the inelastic scattering probability can only be extracted from REELS spectra if the exact shape of the elastic scattering cross-section is accounted for and a quantitative description of surface excitations is available.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: New methods are presented for the evaluation of ion structures and fragmentation pathways using tandem mass spectrometry (MS/MS) with low energy collision-induced dissociation. As an aid for mass spectroscopists, they incorporate a PC software package (named PDNL, written in Turbo-PASCAL 5.5 (Borland), running under DOS (Microsoft) with mouse-control). A database of almost 300 low energy MS/MS spetra is available for library searches. It utilizes a new, intensity-based matching algorithm fitting to the demand of MS/MS data. Computational methods have been developed for (i) the separation of the spectra of unresolved isobaric ions and evaluation of the ratio of the ion abundances, (ii) the evaluation of single-collision spectra using the multi-collisional data map, and (iii) the elucidation of collision-induced dissociation fragmentation pathways. Principal component analyses of sets of at least eight MS/MS spectra were used for a quick comparison of these spectra and for a summary of inter-ion relationships.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 0009-286X
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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