Publication Date:
2015-11-04
Description:
Author(s): A. Pandey, Parthapratim Biswas, and D. A. Drabold We introduce a structural modeling technique, called force-enhanced atomic refinement (FEAR). The technique incorporates interatomic forces in reverse Monte Carlo (RMC) simulations for structural refinement by fitting experimental diffraction data using the conventional RMC algorithm, and minimizes … [Phys. Rev. B 92, 155205] Published Fri Oct 30, 2015
Keywords:
Semiconductors I: bulk
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
Permalink