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  • American Institute of Physics (AIP)  (3)
  • Genetics Society of America (GSA)
  • 2015-2019
  • 2010-2014
  • 1995-1999  (3)
  • 1997  (3)
Collection
Publisher
Years
  • 2015-2019
  • 2010-2014
  • 1995-1999  (3)
Year
  • 1
    Electronic Resource
    Electronic Resource
    Thermal conductivity of thin metallic films measured by photothermal profile analysis (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1510-1513 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Thermal conductivity of nickel and gold films on quartz (thickness 0.4–8 μm) was measured by a modulated thermoreflectance technique recording the surface temperature profile. Model calculations predict an optimum frequency for measuring thermal transport within the film. Measurements on films with various thicknesses reveal a thermal conductivity close to the bulk value for nickel while gold films exhibit a reduced conductivity with decreasing film thickness. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147638
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Growth of CdTe/MnTe tilted and serpentine lattices on vicinal surfaces (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 1113-1115 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have grown by atomic layer epitaxy CdTe/MnTe tilted and serpentine superlattices. These heterostructures are formed by depositing in the step-flow growth mode fractional monolayer superlattices (CdTe)m(MnTe)n, with p=m+n∼1, onto 2 °A and 2 °B Cd0.95Zn0.05Te vicinal substrates. Transmission electron microscopy images reveal a good in-plane CdTe/MnTe separation and a uniform short-range superlattice period. The very existence of those superlattices imply that Te-based vicinal surfaces present a regular array of monomolecular steps, with no important step meandering and no step bunching. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.118501
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  • 3
    Electronic Resource
    Electronic Resource
    Measuring local thermal conductivity in polycrystalline diamond with a high resolution photothermal microscope (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 2966-2972 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A photothermal microscope that provides micrometer lateral and submicrometer depth resolution was designed. Thermal conductivity measurements with modulation frequencies up to 12 MHz on single grains in polycrystalline diamond demonstrate its lateral resolution power even for a highly conducting material. Measured conductivities strongly depend on the averaged volume and values up to 2200 W/mK are found in the high frequency limit where the properties inside a grain are sampled. The capability of the instrument to measure thermal parameters on thin films is demonstrated for gold films evaporated on quartz with a thickness ranging from 20 to 1500 nm. Measurements reveal a strong thickness dependence for both thin film conductivity and the contact resistance between film and substrate. Thermal conductivity decreases monotonically from 230 to 30 W/mK whereas the contact resistance rises from 2×10−7 to 8×10−6 m2K/W with decreasing film thickness. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.364329
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