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  • Articles  (2)
  • 1990-1994  (2)
  • 1990  (2)
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  • Articles  (2)
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  • 1990-1994  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Rapid Communications in Mass Spectrometry 4 (1990), S. 447-448 
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A 4-sector EBEB mass spectrometer, fitted with a liquid secondary-ion mass spectrometer (Cs+) ion source and an array detector has been in use at UCSF for the past 18 months. Using this period, calibration procedures have been developed and operating software refined such that the instrument can now be operated in the tandem mass spectrometry (MS/MS) mode using the array on a routine basis and with a high sample throughput. The instrument has been applied successfully to the analysis of a wide range of peptides, up to molecular weights in excess of 2500. The array is usually operated with a mass resolution of about 1500 full width at half maximum (FWHM), and under these conditions a fragment ion dynamic range of 3000:1 is obtainable. Mass assignment is typically reproducible to within 0.1 u.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Rapid Communications in Mass Spectrometry 4 (1990), S. 318-322 
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Several types of artifacts were shown to be present in 4-sector tandem collision-induced dissociation (CID) mass spectra. In CID spectra of protonated peptides produced by liquid secondary-ion mass spectrometry (LSIMS), peaks corresponding to successive losses of matrix molecules from the precursor ion were observed. In addition, peaks corresponding to MH+ ions of smaller peptides that were also present in the sample/matrix mixture in greater abundance than the selected precursor ion were observed. Both of these types of artifact peaks were shown to originate from the ‘peak-at-every-mass’ chemical noise at the same nominal mass as that selected by the first 2 sectors (MS1). These noise ions are transmitted through to the collision cell and produce fragments that are analysed and detected in the next 2 sectors (MS2). A second, unrelated, kind of artifact was found to be due to decompositions in the second field-free region of MS2 in an EBEB geometry machine. These artifacts, which are detectable over only a very limited mass range when using a conventional single-point detector, can be present over a much greater mass range when an array detector is used and when the collision cell is floated above ground potential. A clear understanding of the origins of all peaks in a CID spectrum is important in order to have a firm foundation for interpretation, manual or computer-aided, of the spectra of unknown compounds.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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