Publikationsdatum:
2016-03-05
Beschreibung:
Article Thermometry using scanning probe techniques allows for the thermal imaging and characterization of devices with nanoscale resolution, however can be hindered by contact-related artefacts. Here, the authors demonstrate a thermal scanning probe approach which eliminates contact-resistance effects. Nature Communications doi: 10.1038/ncomms10874 Authors: Fabian Menges, Philipp Mensch, Heinz Schmid, Heike Riel, Andreas Stemmer, Bernd Gotsmann
Digitale ISSN:
2041-1723
Thema:
Biologie
,
Chemie und Pharmazie
,
Allgemeine Naturwissenschaft
,
Physik
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