ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A new radioisotope excited x-ray fluorescence (XRF) technique which employs source-samples has been applied for the determination of low Z elements in geological materials. The source-samples is prepared by directly inserting about 100 μCi of the radioisotope (Fe-55) into about 10-20 mg of the sample in its holder and placing this directly on the face of the detector window. The precision (relative total standard deviation) of this technique for K2O%, CaO% and TiO2% is about 4% and is compared to conventional radioisotope excited XRF. Finally, the accuracy of this technique is shown by the analysis of five geological reference materials as well as compared to conventional radioisotope excited XRF.
Additional Material:
3 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300120406
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