Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
64 (1994), S. 1283-1285
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Superlattices of Bi1−xSbx/Bi have been grown by molecular beam epitaxy on CdTe(111) substrates. The typical multilayer, consisting of Bi1−xSbx (85 A(ring) with x=0.16) and Bi (75-A(ring)) layers repeated 50 times, was grown at a substrate temperature of 150 °C. The samples were characterized by reflection high-energy electron diffraction (RHEED), θ-2θ x-ray diffraction analysis, and high-resolution transmission electron microscopy. The streaked RHEED patterns with clear Kikuchi lines and the x-ray satellite peaks indicate a good epitaxial layer quality. The bright field transmission electron microscopy image of the superlattice film confirms that a composition modulation exists, even though the Bi1−xSbx and Bi layers have only a slight image contrast.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.110866
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