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  • 1
    Electronic Resource
    Electronic Resource
    Effect of the Adhesive Mass at the Cantilever Beam Tip Position (2007)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 364-366 (Dec. 2007), p. 773-778 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: This study employs finite element simulations to investigate the relationship between theequivalent mass and the real mass of end masses adhered to the tip of the cantilever beam of anatomic force microscope. The equivalent mass was determined by analyzing the variation in theresonant frequency of the cantilever beam caused by the addition of the end mass. The analysisconsidered five different adhesive mass materials, namely copper, aluminum, S45C steel, titaniumalloy and magnesium alloy. Furthermore, the analysis also considerd the effect of the position of theadhesive mass on its equivalent mass value. The numerical results indicate that the equivalentadhesive mass is less than the real adhesive mass. The ratio of the equivalent adhesive mass to thereal adhesive mass is approximately constant for a given adhesive position and adhesive materialand has a value of approximately 0.6361 for a high-density material. Finally, the results show thatan offset of the adhesive mass from the tip position causes a slight change in the value of theequivalent mass to real mass ratio
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/56/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.364-366.773.pdf
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  • 2
    Electronic Resource
    Electronic Resource
    Determining the Thickness and Refractive Index of a Birefringence by Using an Improved Accurate Measurement System (2007)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 364-366 (Dec. 2007), p. 510-515 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: This paper presents a high-precision, non-destructive measurement system fordetermining the thickness and refractive indices of birefringent optical wave plates. Significantly,the proposed method enables the two refractive indices of the optical sample to be measuredsimultaneously. The performance of the proposed system is verified using a commercial quartzoptical wave plate with known refractive indices of 1.5518 e n = and 1.5427 o n = , respectively, anda thickness of 452.1428 μm. The experimentally determined values of the refractive indices arefound to be 1.55190 e n = and 1.54281 o n = , respectively, while the thickness is found to be 452.189μm, corresponding to an experimental error of approximately 0.046 μm. The measurementresolution of the proposed system exceeds that of the interferometer hardware itself and provides asimple yet highly accurate means of measuring the principal optical parameters of birefringent glasswave plates
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/56/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.364-366.510.pdf
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