ISSN:
1013-9826
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Fe/Cu nanometer-scale multilayers with nominal modulation wavelengths ranging from 5to 40 nm are deposited by direct current magnetron sputtering on Si (100) substrates. Modulationstructures of the multilayers are examined by small angle / wide angle x-ray diffraction (SA/WAXRD)and cross-sectional transmission electron microscopy (XTEM). Hardness of the multilayers ismeasured by using nanoindentation. All the multilayers have Fe (110) and Cu (111) textures. Interfacecoherency is observed in the multilayers with designed modulation wavelengths of 5 and 10 nm. Thehardness increases firstly and then deceases with increasing the modulation wavelength, and reachespeak value of 7.29±0.29 GPa in the multilayers with nominal modulation wavelength of 10 nm. Theevolution of the hardness of the mulitlayers is explained by interface width and modulus differencebetween sublayers
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/57/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.373-374.104.pdf
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