Springer Online Journal Archives 1860-2000
Abstract A new method utilizing a cooled, high resolution, windowless Si(Li) x-ray and Auger electron detector has been developed for the accurate measurement of high-Z K-shell fluorescence yields. With this method, values of theK-fluorescence yield ω k have been determined with high accuracy atZ=78, 82, and 92 from the radioactive decay of carrier-free195Au,207Bi, and235Np, respectively. The values of ω k are 0.968±0.008, 0.972±0.008, and 0.970±0.005, respectively where the error limits represent 95% confidence. In addition, relativeK-Auger electron group intensities atZ=92 were measured and found to be(K-LL)∶(K-LX)∶(K-XY)=100∶(65.2±6.0)∶ (8.1±0.8). The experimental results for ω k are compared with the relativistic calculations of Bhalla, Ramsdale and, Rosner, and satisfactory agreement is found.
Type of Medium: