Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
73 (1993), S. 3163-3168
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The absolute intensity of near-ultraviolet emission from a neon Z-pinch plasma is measured with a time-gated, two-dimensional optical multichannel analyzer (OMA). The OMA provides spatial and spectral resolution with a 100 ns gate duration. Spatially resolved continuum emission, Ne viii line emission, and Ne viii line-profile measurements are used to determine the pinch diameter, the density of the neon plasma, and the Ne viii 3p level population.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.352986
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