ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Journal of fish diseases 16 (1993), S. 0 
    ISSN: 1365-2761
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Biology , Medicine
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 2
    ISSN: 1365-2761
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Biology , Medicine
    Notes: Cultured cobia, Rachycentron canadum, of 45–80 g exhibited anaemia and ascites, and a mottled red and grey, extremely enlarged kidney with cream-coloured patches or spherical nodules. Cumulative mortality was about 90% within 1 month. Extrasporogonic or sporogonic stages of a myxosporean appeared in the blood, glomerulus, renal tubules and renal interstitium. The renal tubules were the main target tissue of the parasite and were completely occluded by sporogonic pseudoplasmodia at various degrees of maturity. Many sporogonic stages were attached to the brush border of the epithelium of the renal tubules. Mature spores were seen in the lumen of the tubules. They were elongated or spherical with numerous refractile granules in the cytoplasm. The polar filament formed 3–5 coils. No bacteria or viruses were isolated from the diseased fish. Based on the results of microbiological, histopathological and electron microscopical examinations, the cobia disease was believed to be caused by a Sphaerospora-like myxosporean. This is the first report of a myxosporean in cobia in aquaculture.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Science Ltd
    Journal of fish diseases 23 (2000), S. 0 
    ISSN: 1365-2761
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Biology , Medicine
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 4
    ISSN: 1365-2761
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Biology , Medicine
    Notes: Abstract. A rickettsia-like organism was observed in diseased Nile tilapia, Oreochronuis niloticus (L.), from southern Taiwan. Most affected fish were pale and lethargic with haemorrhages and ulcers on the skin. The most significant gross pathological changes were varying degrees of ascites, and enlargement of the spleen, kidney and liver. Marked white nodules (as ring-shaped foci), varying in size, were found in these organs. A Gram-negative, rickettsia-like organism (RLO) frequently appeared as inclusions or within host cell intra-cytoplasmic vacuoles. Fibrin thrombi, perivascular necrosis, chronic inflammatory cells with hypertrophy and RLO-laden cells were characteristic of the disease. White nodules induced in experimental fish were similar to naturally infected cases and RLOs were reisolated in tissue culture using a CHSE-214 cell line. This provides evidence that the systemic granulomas in Nile tilapia were caused by RLOs.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 5
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Resistance saturation as a function of current density, stripe length, stripe width, and temperature is investigated for a two-level structure with Ti/AlCu/Ti/TiN stripes and interlevel W stud vias. A simple model based on first principles is presented, which relates the maximum fractional resistance change to the current density and stripe length. Experimental results for stripe lengths of 30, 50, 70, and 100 μm are in good agreement with the model predictions. Estimated void sizes based on the resistance saturation data are consistent with the actual void sizes determined from scanning electron microscopy analysis. A weak temperature dependence is found for 0.33 μm-wide samples in the range 170–250°C, while a strong width dependence is observed between 0.33 and 1.50 μm- wide samples. The width dependence is qualitatively explained in terms of a relaxed bulk modulus that depends on the aspect ratio of the interconnect lines. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 2712-2714 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report real-time, in situ x-ray microbeam measurements of electromigration-induced Cu redistribution, and the concurrent local stress variation in Al(Cu) wires. The data, which were obtained by combining x-ray microtopography with energy-dispersive fluorescence analysis, encompass both the early and late stages of electromigration as well as the postrelaxation stage at high temperature with the current turned off. We observe that both Cu concentration and stress values show unexpected local variations that may reflect the effect of local configuration such as film–substrate interface integrity or microstructure. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 3598-3600 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The electromigration threshold in copper interconnects is reported in this study. The length-dependent electromigration degradation rate is observed and quantified in the temperature range of 295–400 °C. Based on the Blech electromigration model [I. A. Blech, J. Appl. Phys. 47, 1203 (1976)], a simplified equation is proposed to analyze the experimental data from various combinations of current density and interconnect length, as well as to estimate the electromigration threshold product of current density and line length, (jL)th, at a certain temperature. The resulting (jL)th value appears to be temperature dependent, decreasing with increasing temperature in the tested range between 295 and 400 °C. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 3726-3728 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a set of data on the evolution of stress in thin-film metallization wires during the transient region of electromigration. The excellent strain sensitivity of the x-ray microbeam topography technique allows real-time, spatially resolved measurements at the lowest currents reported to date (1.0×104–1.4×105 A/cm2). While the steady-state results agree qualitatively with the Blech's stress gradient model [I. A. Blech, J. Appl. Phys. 47, 1203 (1976)], the threshold-length product calculated from our data is about 2–3 times smaller than previously reported values. Stress evolution during the transient state displays local fluctuations which cannot be attributed to experimental errors, indicating possible microstructural effects on local flux divergence even in the case of wide, nonbamboo wires. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 1296-1298 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electromigration-induced stress distributions in 200 μm long, 10 μm wide aluminum conductor lines in 1.5 μm SiO2 passivation layers have been investigated in real time using synchrotron-based white-beam x-ray microdiffraction. The results show that a steady-state linear stress gradient along the length of the line developed within the first few hours of electromigration and that the stress gradient could be manipulated by controlling the magnitude and the direction of the current flow. From the current density dependence of the steady-state stress gradient, the effective valence Z* was determined to be 1.6 at 260 °C. From the time dependence of the transient-state stress gradient, the effective grain boundary diffusion coefficient Deff was estimated to be 8.2×10−11 cm2/s at 260 °C using Korhonen's stress evolution model [M. A. Korhonen, P. Børgesen, K. N. Tu, and C.-Y. Li, J. Appl. Phys. 73, 3790 (1993)]. Both Z* and Deff values are in good agreement with the previously reported values. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 1031-1041 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Phosphor screens which convert x-ray images to visible light images are key components in two-dimensional charge coupled device (CCD) based detector systems used for x-ray diffraction. Some experimental and theoretical aspects of phosphor screen performance are described in this article. The efficiencies of x-ray-to-light conversion were measured using a CCD camera for transmission phosphor screens fabricated from two different phosphor powders, Y2O2S:Eu (P22R) and Gd2O2S:Tb (P43), for screen mass thicknesses of 3–50 mg/cm2 and for x-ray energies of 7–34 keV. A model was developed and evaluated for the dependence of the emitted light brightness on screen thickness and x-ray energy. Inputs to the model are x-ray absorption coefficients available from published compilations, and light attenuation versus thickness data, which were determined experimentally for the phosphors and found to be dominated by scattering rather than absorption. The angular distribution of emitted light, measured for one of the phosphor screens, was found to be nearly Lambertian. Broadening of image features in the x-ray-to-visible-light conversion by phosphors for 19.6 keV x-rays was found to increase approximately linearly with phosphor screen thicknesses in the range of 30–160 μm, but with a minimum width of 110 μm for P22R phosphor and 70 μm for P43 phosphor. In the range of 7–15 keV, maximum brightness was obtained for P43 phosphor screens of about 10 mg/cm2 mass thickness (60 μm). For P22R screens, the thickness for maximum brightness increased from about 8 mg/cm2 (50 μm) for 7 keV to more than 46 mg/cm2 (210 μm) for 15 keV. For 7 keV the maximum brightnesses for P22R and P43 phosphors were about the same. For 10 keV the maximum brightness for P43 phosphor was about 60% greater than the maximum brightness for P22R phosphor samples tested. For 15 keV the maximum brightness for P43 phosphor was again about 60% greater than that for the P22R samples tested. In the range of 20–34 keV, maximum brightness would occur for thicknesses greater than 46 mg/cm2 (210 μm) for P22R phosphor and greater than 40 mg/cm2 (160 μm) for P43 phosphor. Comparing the brightness for 90 μm thickness for the two phosphors, P43 was about 30% brighter for 20 keV, 20% brighter for 24 keV, and 10% brighter for both 29 and 34 keV. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...