Author(s): J. T-Thienprasert, S. Rujirawat, W. Klysubun, J. N. Duenow, T. J. Coutts, S. B. Zhang, D. C. Look, and S. Limpijumnong The synchrotron x-ray absorption near edge structures (XANES) technique was used in conjunction with first-principles calculations to characterize Al-doped ZnO films. Standard characterizations revealed that the amount of carrier concentration and mobility depend on the growth conditions, i.e. H 2 (o... [Phys. Rev. Lett. 110, 055502] Published Mon Jan 28, 2013
Condensed Matter: Structure, etc.