ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Synchrotron x-rays are used for in situ determination of oxide strain, during oxideformation on a Kanthal A1 FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (~80keV) x-rays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains atelevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strainrelaxation was observed during isothermal holds, suggesting oxide creep as a majorrelaxation mechanism. Upon cooling to room temperature, significant residual strainsdeveloped, with a corresponding in-plane residual stress of -3.7 GPa
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/10/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.490-491.287.pdf
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