Analytical Chemistry and Spectroscopy
Wiley InterScience Backfile Collection 1832-2000
The elements Nb, Zr, Ta, Y, Ce, Nd, Lu, Ba and Sr were calibrated on a wavelength-dispersive spectrometerequipped electron probe microanalyser (EPMA) using existing standards and a Ta-bearing primary glass standard manufactured for Ta calibration. These calibrations were tested using a manufactured secondary glass standard doped with 600-1800 ppm of these elements. The EPMA calibrations reproduced the glass secondary standard concentrations to within ±10% relative (except for Y) with detection limits of 40-100 ppm. The accuracy of this technique was compared with that of proton-induced x-ray emission (PIXE) determinations on the secondary standard.
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