Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
65 (1994), S. 1367-1369
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Novel deposition behavior was observed when 1,4-dicyanobenzene was sublimed onto copper micropatterns on silicon wafer. On the patterns copper-phthalocyanine whiskers and debris of similar size were formed and preferentially oriented along or perpendicular to the copper lines. The directional growth was confirmed to have nothing to do with crystal axis of the silicon, but was considered to be due to the periodic structure of the copper lines.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.112054
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