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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 169-172 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning tunneling microscopy and atomic force microscopy were used to index the faces and orientation of the sloping triangular defect which often appears on the {100} surfaces of chemical-vapor-deposited diamond. These features were confirmed to be 〈111〉 penetration twins which appear as sections of cubo-octahedra oriented with a 〈221〉' direction parallel to the "parent'' crystal's {100} surface normal. Multiple twins of this type can give rise to the pentagonal structures usually attributed to simpler combinations of ordinary 〈111〉 twins. The ability to suppress this twin by proper choice of growth conditions is a major factor in controlling the morphology of vapor-grown diamond.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 4549-4549 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In situ temperature-dependent spin-polarized cascade electron spectroscopy is used to study exchange coupling processes between a magnetic substrate and a magnetic overlayer separated by a nonferromagnetic spacer layer. Relative Auger intensities of the overlayer/substrate configurations as a function of overlayer coverage together with a model by Ossicini are used to evaluate the degree to which these trilayer structures grow by a continuous layer growth mode. Measurement of the spin polarization and Auger spectroscopy are used during film growth as criteria of chemical film purity. Evidence will be given to show that the oscillatory magnetic coupling behavior as a function of Cr thickness of a NiFe/Cr/NiFe trilayer changes significantly depending on the deposition temperature, which may be associated with microstructural changes. Competing coupling mechanisms are thought to account for this behavior. Data will also be presented to suggest how trace quantities of residual gas sorbates, presumably acting as surfactants, can dramatically alter the magnetization behavior of ultrathin films. Significant increases in magnetization of a 5-A(ring) Fe overlayer film in a Fe/Ta/Fe trilayer structure were observed and are attributed to changes in wetting characteristics at the Fe/Ta interface which cause morphological changes in the film structure. Conversion of weakly interacting magnetic islands to a long-range ferromagnetic continuous film medium exhibiting remanence and a steady-state Brillouin functional M(T ) behavior is thought consistent with these observations. The possible significance of these kinds of observations to some conflicting data in the literature will be mentioned.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2255-2257 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A miniature capacitive force sensor which fits in the sample position of an atomic force microscope (AFM) has been used to calibrate the force applied by the scanning tip during nanohardness measurements. The sensor is simple, physically robust, and easily fabricated from readily available materials. It can be operated with commonly available electronic instrumentation. The device described here is optimized for tip-sample forces between 10−4 and 10−2 N, a range useful for micrometer-scale mechanical modification of surfaces. With minor design changes, sensors of this general type should be capable of much greater sensitivity. The sensor is calibrated outside the AFM by the application of free weights. Calculated estimates of AFM cantilever force constants are difficult for all but the simplest geometries and may rely on uncertain values for certain critical dimensions and material properties. These estimates can thereby be replaced by a simple and direct measurement.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 4046-4048 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: When scanning steeply sloped features which are near micron size or taller, scanning tunneling microscopes with conventional feedback control loops exhibit slower response on downhill slopes than on uphill slopes. This effect is caused by the exponential dependence of the tunneling current on the tip-sample distance. A gap smaller than the setpoint produces a sizable error signal, whereas a gap larger than the setpoint gives only a weak error signal. As the scan rate is increased, the tip begins "flying'' well above the surface on steep downhill regions. We have developed a modification of the conventional integral feedback system which eliminates this problem. This circuit makes the error signal growth with increasing distance between the tip and sample similar to the usual exponential growth when the tip-sample distance decreases. This modification allows an increase in scan rates by a factor of 5–10 with no reduction in image quality. The modification can be dialed in or out of circuit as needed, such as when switching between large scale images and atomic scale images, and can easily be installed in any existing scanning tunneling microscope that uses an analog feedback circuit.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 49 (1989), S. 439-447 
    ISSN: 1432-0630
    Keywords: 75.70.Ak ; 75.30.Pd ; 79.20.Hx
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The spin polarizationP of the low energy cascade electrons excited with a primary unpolarized electron beam is measured with ultrathin films of permalloy (Ni80Fe20) as a function of film thickness, external magnetic field, and temperatureT. Surface adsorbates of small concentrations of less than 10% of a monolayer can change the Curie point and the saturation value ofP 0(T→0) by as much as 30%. The Ta-substrate induces a magnetically dead region in permalloy. Conventional spin wave theory cannot account for the observed smallT-dependence of the magnetizationM. Films on a nonmagnetic substrate are compared to similar films coupled to bulk permalloy over an interface of Ta. TheT-dependence ofM with the coupled films can be explained by spin wave theory. At lowT, the films coupled to the bulk exhibit a faster decrease ofM than the uncoupled films. We propose that this thermal stabilization of the magnetization in very thin ferromagnetic films is due to quenching of the long wavelength spin modes.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 52 (1991), S. 160-166 
    ISSN: 1432-0630
    Keywords: 81.60Jw. ; 78.65Hc
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Plasma polymerized tetrafluoroethylene (PPTFE) is shown to undergo efficient 248 nm excimer laser ablation. The principle difference between this material and the analogous polytetrafluoroethylene (PTFE), which results in only poor quality ablation, is PPTFE's much greater absorption coefficient (7×104 vs. ∼102 cm−1). A plot of the ablation depth per pulse versus incident fluence indicates that the threshold for significant ablation occurs near 50 mJ/cm2, and that approximately 0.7 μm/pulse can be removed at 800 mJ/cm2. Near threshold, the ablation rate curve can be fit by a single Arrhenius-type exponential. This suggests that the removal process is at least partially governed by a photothermal process, similar to well-known laser induced thermal desorption experiments. In the very low fluence regime between 10 and 30 mJ/cm2, small removal rates are measured in a process likely dominated by non-thermal ablation. The paper concludes with a discussion of the high quality, micron-size features that can be directly patterned into PPTFE surfaces.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 52 (1991), S. 206-209 
    ISSN: 1432-0630
    Keywords: 75.30.Pd ; 79.20.Hx ; 75.70.Ak
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract A surface probing depth of only ∼ 2 layers for low energy cascade electrons excited with a 3.2 keV primary electron beam is clearly demonstrated by model experiments with non-magnetic overlayers of Ta on magnetic substrates of Fe/Ni80Fe20. This result establishes a short probing depth of low energy electrons in transition metals generalizing the previously observed short magnetic probing depth for spin-polarized electrons in ferromagnets. The short probing depth sheds new light on a number of spectroscopic observations on ferromagnetic transition metals, and has important implications concerning surface magnetic properties and scattering processes of hot electrons in transition metals.
    Type of Medium: Electronic Resource
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  • 8
    Publication Date: 1989-04-17
    Print ISSN: 0031-9007
    Electronic ISSN: 1079-7114
    Topics: Physics
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  • 9
    Publication Date: 1988-08-08
    Print ISSN: 0031-9007
    Electronic ISSN: 1079-7114
    Topics: Physics
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  • 10
    Publication Date: 1992-09-01
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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