Publication Date:
2016-04-12
Description:
We describe a tool for studying the two-dimensional spatial variation in electronic properties of organic semiconductors: the scanning time-of-flight microscope (STOFm). The STOFm simultaneously measures the transmittance of polarized light and time-of-flight current transients with a pixel size
Print ISSN:
0021-8979
Electronic ISSN:
1089-7550
Topics:
Physics
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