ISSN:
0168-1176
Keywords:
negative thermal ion mass spectrometry
;
secondary ion mass spectrometry
;
sputter-induced resonance ionization mass spectrometry.
;
thermal ion mass spectrometry
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Chemistry and Pharmacology
,
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/0168-1176(92)80063-7
Permalink