Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
65 (1994), S. 1641-1643
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Raman scattering has been used to measure phonon linewidths and frequencies of a number of high quality diamond crystals. It was found that the defect induced broadening produced a Lorentzian line shape. The smallest Lorentzian linewidth of 1.68 cm−1 at 300 K caused by anharmonicity and defects was obtained for the high pressure synthesized diamond. The linewidths of the diamonds grown by chemical vapor deposition varied, with the best sample having a linewidth of 2.31 cm−1, close to the values for natural diamonds. No measurable phonon frequency shift caused by defects was found.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.112936
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