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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 3676-3681 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A nondestructive technique to study the partial density of states of atoms at buried interfaces is presented. A high density of interface atoms has been mimicked by using a periodic multilayer structure. The silicon-carbon interface was used as a test case. Fifty alternating silicon-carbon layers were laid down, in which silicon layers nominally between 3 and 30 A(ring) in thickness alternate with carbon layer pairs approximately 30 A(ring) thick made by magnetron sputtering. The silicon L2,3 emission spectra was excited by monochromatized synchrotron radiation, and the s-like partial density of states of the silicon valence band was obtained. The spectrum of the thinnest silicon layer is similar to that of silicon as an impurity. When there are approximately two layers of silicon, the spectrum resembles that of silicon carbide, and as the layers become thicker, the spectrum is similar to that of amorphous silicon.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The IBM/TENN/TULANE/LLNL/LBL Beamline 8.0 at the advanced light source combining a 5.0 cm, 89 period undulator with a high-throughput, high-resolution spherical grating monochromator, provides a powerful excitation source over a spectral range of 70–1200 eV for surface physics and material science research. The beamline progress and the first experimental results obtained with a fluorescence end station on graphite and titanium oxides are presented here. The dispersive features in K emission spectra of graphite excited near threshold, and found a clear relationship between them and graphite band structure are observed. The monochromator is operated at a resolving power of roughly 2000, while the spectrometer has a resolving power of 400 for these fluorescence experiments. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1745-1747 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Beamline 9.3.1 at the Advanced Light Source (ALS) is a windowless beamline, covering the 1–6 keV photon-energy range, designed to achieve the goals of high energy resolution, high flux, and high brightness at the sample. When completed later this year, it will be the first ALS monochromatic hard-x-ray beamline, and its brightness will be an order-of-magnitude higher than presently available in this energy range. In addition, it will provide flux and resolution comparable to any other beamline now in operation. To achieve these goals, two technical improvements, relative to existing x-ray beamlines, were incorporated. First, a somewhat novel optical design for x rays, in which matched toroidal mirrors are positioned before and after the double-crystal monochromator, was adopted. This configuration allows for high resolution by passing a collimated beam through the monochromator, and for high brightness by focusing the ALS source on the sample with unit magnification. Second, a new "Cowan type'' double-crystal monochromator based on the design used at NSLS beamline X-24A was developed. The measured mechanical precision of this new monochromator shows significant improvement over existing designs, without using positional feedback available with piezoelectric devices. Such precision is essential because of the high brightness of the radiation and the long distance (12 m) from the source (sample) to the collimating (focusing) mirror. This combination of features will provide a bright, high resolution, and stable x-ray beam for use in the x-ray spectroscopy program at the ALS. © 1995 American Institute of Physics.
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  • 4
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new "Cowan type'' double-crystal monochromator, based on the boomerang design used at National Synchrotron Light Source (NSLS) beamline X-24A, has been developed for beamline 9.3.1 at the Advanced Light Source (ALS), a windowless ultrahigh vacuum beamline covering the 1–6 keV photon-energy range. Beamline 9.3.1 is designed to simultaneously achieve the goals of high energy resolution, high flux, and high brightness at the sample. The mechanical design of the monochromator has been simplified, and recent developments in technology have been included. Measured mechanical precision of the monochromator shows significant improvement over existing designs. In tests with x-rays at NSLS beamline X-23A2, maximum deviations in the intensity of monochromatic light were just 7% during scans of several hundred eV in the vicinity of the Cr K edge (6 keV) with the monochromator operating without intensity feedback. Such precision is essential because of the high brightness of the ALS radiation and the overall length of beamline 9.3.1 (26 m). © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A knowledge of the position, size, and stability of the source and the angle of emission of synchrotron radiation (SR) from the storage ring are essential for optimizing the operation of storage ring, insertion devices and monochromators. Berkeley's Advanced Light Source (ALS) has a natural emittance of 3.4×10−9 mrad, and has beam sizes σh and σv (assuming a 10% emittance ratio into the vertical direction) in bending magnet 1 (BM1) of 44 and 83 μm, respectively. Simple diffractive optical calculations show that imaging this beam using visible light optics is not feasible and imaging must be performed using photon energies greater than 50 eV. This will be the same for all third generation low emittance storage rings. The synchrotron radiation diagnostics at ALS will consist of an imaging system for 200 eV photons and a "white beam'' port with a streak camera to obtain the timing information. The imaging system will employ two crossed spherical mirrors in a Kirkpatrick–Baez configuration, to eliminate astigmatism. Use of 1:1 imaging will eliminate coma, resulting in an image of the source which is only limited by the residual aberrations of the optics. Real time imaging of the beam is deemed feasible by the use of a high resolution charged coupled device (CCD), and the associated electronics necessary to read the CCD. The design of the imaging system of the diagnostic beamline for ALS and the detection system will be discussed with a view toward applications in other third generation SR sources.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Beamline 9.3.1 at the Advanced Light Source (ALS) is a windowless beamline, covering the 1–6 keV photon energy range. This beamline is designed to achieve the goal of high brightness at the sample for use in the x-ray atomic and molecular spectroscopy (XAMS) science, surface and interface science, biology and x-ray optical development programs at ALS. X-ray absorption and time-of-flight photoemission measurements in 2–5 keV photon energy range along with the flux, resolution, spot size and stability of the beamline will be discussed. Prospects for future XAMS measurements will also be presented. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1555-1556 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The Advanced Light Source (ALS) at the Lawrence Berkeley Laboratory (LBL), scheduled to be operational in the spring of 1993 as a U.S. Department of Energy national user facility, will be a next-generation source of soft x-ray and ultraviolet (XUV) synchrotron radiation. Undulators will provide the world's brightest synchrotron radiation at photon energies from below 10 eV to above 2 keV; wiggler and bend-magnet radiation will extend the spectral coverage with high fluxes above 10 keV. These capabilities will support an extensive research program in a broad spectrum of scientific and technological areas in which XUV radiation is used to study and manipulate matter in all its varied gaseous, liquid, and solid forms. The ALS will also serve those interested in developing the fabrication technology for microstructures and nanostructures, as well as for characterizing them.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The geometric and electronic structure of a buried monolayer of boron nitride (BN) has been probed using resonant soft x-ray fluorescence (SXF). By using the strong π* resonance feature in the resonant fluorescence spectrum near the B (1s) threshold, we were able to detect the BN thin film and examine changes in its electronic structure when the monolayer is placed between different materials. Our results demonstrate the capability of the resonant SXF technique for probing the element-specific electronic structure of a buried thin film nondestructively. © 1995 American Institute of Physics.
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  • 9
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Photoelectron energy distribution spectra taken for the first time on micrometer-sized areas of cleaved GaAs(110) reveal rigid shifts from location to location in the photoemission core level peak energies, indicating band-bending changes on a microscopic scale.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 9 (1980), S. 81-89 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Optimized multilayer X-ray spectrometry, using lead myristate and lead stearate analyzers (2d values of 80 and 100 Å) has been applied to the measurement of the O--Kα and the C--Kα spectral bands from CO and CO2 in the gas and solid phases. The LII, III spectra were also measured for argon in the gas and solid states under similar conditions in order to identify and to minimize any non-molecular components in the CO and CO2 spectra. These molecular orbital data have been related to those obtained with X-ray and ultraviolet photoelectron spectroscopy and grating X-ray spectroscopy. The consistency of the results of these complementary measurements is excellent. The ionization energies for the C and O 1s levels have been determined to be 295.4 and 542.0 eV for CO and 296.8 and 540.3 eV for CO2. The MO data have also been compared with that predicted from the symmetry, strength and binding energy of the molecular orbital spectral components as calculated using the currently available computational models, CNDO/2, MINDO/3, MNDO, extended Hückel and ab initio. The molecular orbital calculated results for these organic compounds, CO and CO2, are not in as good agreement with the experimental data as previously demonstrated for molecular orbital spectra measured for C--Kα and the LII, III bands of Cl, S and P for both organic and inorganic compounds.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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