Publication Date:
2011-04-30
Description:
Author(s): A. M. Pereira, J. P. Araújo, J. R. Peixoto, M. E. Braga, P. A. Algarabel, C. Magen, L. Morellon, M. R. Ibarra, and J. B. Sousa We present a detailed study of the temperature dependence of the electrical resistivity [ρ(T)] in the range 13–300 K for the Ho_{5} (Si_{x} Ge_{1-x} )_{4} system. Three distinct ρ(T) behaviors are observed, associated with different magnetic and crystallographic structures along the series. In t... [Phys. Rev. B 83, 144117] Published Fri Apr 29, 2011
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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