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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 69-72 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We demonstrate a new type of ion source for producing either pulsed or continuous negative ion beams. The source, dubbed the "reversal ion source,'' utilizes an electrostatic "mirror'' which reverses trajectories in an electron beam, producing electrons at their turning point having a distribution of velocities centered at zero velocity. A gas which attaches zero-velocity electrons is introduced at this turning point. Negative ions are produced by the attachment or dissociative attachment process. The cross section for this process is extremely large, varying as (electron energy)−1/2, or just the s-wave threshold law. The operation of the source is demonstrated for continuous and pulsed production of Cl− beams by dissociative attachment to CFCl3. Estimates of the current density of this source are given, and applications to the production of ions through higher energy resonances are discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 421-423 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A silicon wafer has been oxidized at room temperature in vacuum using a pure, ground-state beam of O− ions. The beam was of sufficiently low energy that no displacement damage or implantation was energetically possible. The resulting SiO2 films were analyzed with x-ray photoelectron spectroscopy. A logarithmic dependence of oxide thickness on dose was observed, with an extrapolated oxidation efficiency of unity for the clean silicon surface. A distinct initial oxidation phase was observed, with an anomalously high level of silicon suboxides. In addition, the valence-band offset between the silicon and the oxide was unusually small, suggesting a large interfacial dipole.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 97 (1992), S. 4111-4114 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Optical emission has been observed corresponding to vibrational bands in the NH (A 3Π→X 3Σ−) electronic transition during collisions of 5 eV, ground-state oxygen O(3P) atoms with MgF2 and Ni surfaces continuously exposed to a beam of hydrazine (N2H4). The NH emission intensity is observed to be about five times greater for MgF2 than for Ni. No dependence on temperature was observed for either surface in the range 240–340 K, implying that the NH-producing intermediate species is tightly bound. The half-lifetime for desorption of hydrazine from each surface was measured. This was found to be 120 min for the MgF2 surface at 240 K, and ≤20 min for Ni. After exposure the surface composition was measured using x-ray photoelectron spectroscopy (XPS) on the exposed and unexposed areas of both targets.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 1754-1757 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A three-mesh gate is used in a time-of-flight (TOF) apparatus to analyze the velocity of positive ions. Test results and a theoretical description are presented of an effect arising from trapping ions between meshes of a two-gate TOF velocity analyzer. The entrapped ions produce a side peak in the TOF spectra corresponding to faster ions. The onset and relative height of the side peak is dependent on the gating voltage and risetime of the pulsing electronics, while the relative intensity depends upon the velocity being sampled and the ratio of the gate width to duration.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 470-476 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Theoretical considerations and test results are presented for a new-type velocity analyzer for incident fast neutral particles, positive ions, and negative ions. Velocity analysis is carried out by means of a pulsed, three-gate time-of-flight (TOF) technique capable of eliminating alias velocities (harmonics) to sixth order. In addition the design and operation are presented of a four-element ion lens system, with small spherical and chromatic aberrations, suitable for interfacing a large-diameter ion beam from the TOF section with a subsequent mass analyzer.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1393-1397 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A miniature quadrupole mass spectrometer array consisting of 16 rods in a 4×4 array is reported. Each rod is 25 mm in length and 2 mm in diameter. The ionizer is of a miniature Nier-type design, and the detector is a channel-type electron multiplier. Operating frequencies are 5.3, 7.1, and 12.9 MHz. The mass range demonstrated herein is 1–300 u; and the resolution of the system is 0.1–0.5 u (full width at half-maximum), or m/Δm=600. The present sensitivity is calculated and measured to be approximately 1×1012 counts/Torr s. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 2157-2160 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A Paul ion trap has been developed for use as a high-resolution mass spectrometer. It is of small size (r0=10 mm), having a resolution of m/Δm=324, which is limited by the machining accuracy of the trap. It has a demonstrated mass range of 1–300 u, and a sensitivity of 2×1014 counts/Torr s, or to 500 parts per trillion detection sensitivity in a typical vacuum of 10−5 Torr. Ionization of the room-temperature gas within the trap is carried out with an electron beam traversing the trapping volume. The trap operates in a radio frequency only mode, and no dc is required. Trapping is accomplished within the well depth of the dynamic radio frequency potential, and no cooling gas is required, such as helium. This combination of factors makes the trap potentially of use for autonomous operation in harsh environments requiring low power, low weight, and low volume, such as undersea, on the surface of a planet or asteroid, or in a spacecraft. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 397-401 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Effects of H− production in a multicusp ion source are measured by separately mixing with hydrogen small amounts (0.33%–10%) of water, ammonia, methane, and hydrazine—molecules which produce large amounts of H− via dissociative attachment (DA) resonances at higher electron energies. The mixing was done in a separate reservoir, with careful measurement of individual pressures. Experimental enhancements of 1.4 and less were observed, whereas calculated enhancements, using accurate DA cross sections for ground-state H2, should have produced factors of 1.5, 3.0, 1.3, and 2.4 enhancements for water, ammonia, methane, and hydrazine, respectively, at a mean electron energy of 1.0 eV in the extraction region. The difference is accounted for by including, in the enhancement calculation, vibrationally and rotationally excited H2 molecules, with v‘=5–11, and J‘=0–5, and the large DA cross sections for the excited H2(v‘,J‘). The relative populations of H2(v‘,J‘) thus obtained are found to be substantially smaller than those predicted by theoretical calculations. The effect on H− current was also studied by mixing small amounts of SF6 with H2. A 1.5% mixture was found to reduce the H− output by one half.
    Type of Medium: Electronic Resource
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  • 9
    Publication Date: 1993-07-01
    Print ISSN: 1050-2947
    Electronic ISSN: 1094-1622
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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  • 10
    Publication Date: 1997-03-01
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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