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  • 1
    Electronic Resource
    Electronic Resource
    Magnetic and magneto-optical investigation of CoCrTa and CoCrPt films : The 41st annual conference on magnetism and magnetic materials (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 5650-5652 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic and magneto-optic measurements (polar Kerr rotation and ellipticity) have been taken for a series of CoCrTa and CoCrPt single layer films with different thicknesses. The magnetic layers were rf sputter deposited onto constant thickness titanium layers on glass substrates at room temperature. Experimental data were obtained at two different wavelengths, i.e., 825 and 670 nm. The perpendicular coercivity Hc measured at the two wavelengths increased with film thickness. Conversely, the lower thickness showed the highest θk and this decreased as the thickness increases. The opposite trend has been noticed for CoCrPt films. There is no difference in the grain size from transmission electron microscopy examination. The results of the investigation are presented in the context of the need for magneto-optic material to be optimized for short wavelength applications in the future. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.364684
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  • 2
    Electronic Resource
    Electronic Resource
    CoNbFe soft magnetic thin-film backlayers for glass computer disks : 35TH ANNUAL CONFERENCE ON MAGNETISM AND MAGNETIC MATERIALS San Diego, California (USA) 29 Oct−1 Nov 1990 (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 5178-5180 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Co84Nb12Fe4 films with very low coercivity down to 1 A/m, anisotropy field 1100 A/m, and saturation magnetic induction 1.1 T have been deposited by rf sputtering onto chemically strengthened glass disk substrates as a backlayer for perpendicular recording Winchester disks. Values of coercivity and anisotropy field were studied over a thickness range from 30 to 15 000 A(ring) and found to be a strong function of film thickness. Comparisons between Néel's prediction for wall motion coercivity mechanism and the experimental data were made. The experimental coercivity fits the Néel formula when films are thicker than 400 A(ring). The dependence of coercivity and anisotropy field on deposition conditions was also characterized. The thermal stability of the films was studied by differential scanning calorimetry (DSC) and by thermal annealing up to 500 °C. The crystallization temperature of the CoNbFe films is about 450 °C determined from DSC analysis. Thermal annealing revealed that the magnetic properties were very stable when the annealing temperature was below 400 °C.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.348119
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  • 3
    Electronic Resource
    Electronic Resource
    Measurement of field-dependent surface impedance tensor in amorphous wires with circumferential anisotropy (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4804-4806 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The surface impedance tensor (final sigma)(circumflex) is found for 120 μm diameter Co-based amorphous wires as a function of a dc axial magnetic field Hex. Contrary to the usual practice of giant magneto-impedance experiments, the voltage response is measured not only across the wire but also in the external coil (secondary coil), and the wire is subjected to an ac current flowing through it or the coil (primary coil), which allows all the components of the impedance tensor (final sigma)zz, (final sigma)cursive-phicursive-phi and (final sigma)zcursive-phi=(final sigma)cursive-phiz to be determined. Under certain conditions, they all are very sensitive to Hex (especially (final sigma)cursive-phicursive-phi: 100–250%/Oe) but exhibit a different field behavior: the diagonal terms (final sigma)zz and (final sigma)cursive-phicursive-phi are symmetrical with respect to Hex whereas the off-diagonal terms (final sigma)zcursive-phi=(final sigma)cursive-phiz are antisymmetrical, and at high frequencies, (final sigma)zz has a minimum at Hex=0 where (final sigma)cursive-phicursive-phi has a maximum. The effect of a moderate dc bias current Ib is demonstrated to be favored for (final sigma)zcursive-phi and (final sigma)cursive-phiz, which are nearly zero for Ib=0. These new magneto-impedance characteristics may further expand the application opportunities for the GMI effect. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373165
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  • 4
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy and micromagnetic study of cross-tie wall structures in Co91Nb6Zr3 amorphous thin films (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 1096-1102 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High resolution images of cross-tie domain wall structures have been obtained by magnetic force microscopy (MFM) for a 37.5 nm Co91Nb6Zr3 film using a NiFe thin film coated tip. Between successive cross ties, the main or spinal wall was found to be consistently subdivided unequally into pairs of oppositely oriented Néel wall sections separated by circular Bloch lines. Main and wing walls intersect at cross Bloch lines. A reversed-contrast MFM image of the same uneven cross-tie wall structure was obtained after reversing the tip magnetization. MFM images reflect only the field from the divergence of the underlying magnetization M and contain no direct information on curl M. Accordingly they are best interpreted by comparison with the magnetization pattern of a similar cross-tie structure obtained by micromagnetic computation. This enables the cross and circular Bloch line singularities to be distinguished in the MFM images of the cross-tie structure. By combining repeated observations made with opposite tip magnetizations, disturbance of the main and wing wall structures by the tip was extracted from the MFM signal which was then compared with the signal computed for a two-dimensional model wall. The main wall was found to be an asymmetric Néel wall with a weak S shaped magnetic structure. The wing walls were found to be Néel walls of acute angle, decreasing with distance from the spine. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371985
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  • 5
    Electronic Resource
    Electronic Resource
    Two-dimensional analysis of magnetoimpedance in magnetic/metallic multilayers (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7221-7223 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article concerns the effect of the in-plane film size on the magnetoimpedance (MI) characteristics in magnetic/metallic multilayers. The problem is approached by a two-dimensional solution of the Maxwell equations in a symmetrical three-layer film. If the edge effect is neglected, the magnetic flux generated by the current flowing through the film is confined within the outer magnetic layers. In a finite width sandwich, the flux leaks through the inner conductor. This process eventually results in a considerable drop in MI ratio if this width is smaller than the critical flux decay length depending on the effective transverse permeability, layer thickness, and frequency. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1361048
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  • 6
    Electronic Resource
    Electronic Resource
    Surface impedance tensor in amorphous wires with helical anisotropy: Magnetic hysteresis and asymmetry (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7224-7226 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article concerns the investigation of the magnetic behavior of the surface impedance tensor (final sigma)(circumflex) in CoSiB amorphous wires having a residual torsion stress and a helical anisotropy. The full tensor (final sigma)(circumflex) involving three different components is found by measuring the S21 parameter at a required excitation with a Hewlett-Packard network/spectrum analyzer at MHz frequencies. In general, the impedance plots versus axial magnetic field Hex exhibit a hysteresis related to that for the case of static magnetization. The diagonal components of (final sigma)(circumflex) (longitudinal (final sigma)zz and circular (final sigma)cursive-phicursive-phi) show a sharp peak in a narrow field interval where the domain walls form and contribute to the ac magnetization dynamics. This peak is not seen for the off-diagonal component (final sigma)zcursive-phi ((final sigma)cursive-phiz) since the existence of the domain structure suppresses it. Applying a dc bias current results in a gradual transition to a nonhysteretic asymmetrical behavior with an enhanced sensitivity. The portions of the experimental plots associated with the rotational dynamic process are in qualitative agreement with the theory based on a single-domain model. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1357119
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  • 7
    Electronic Resource
    Electronic Resource
    Asymmetric biasing fields from mismatched current-carrying overlay conductors on magnetoresistive replay sensors (1985)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 3982-3984 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetoresistive thin-film sensors used in magnetic recording applications are often linearized using a transverse biasing field. For single-domain behavior the biasing field is computed as the average planar value throughout the volume of the sensor element. This paper shows how the correct bias field can be calculated in the general case for a nonmagnetic current-carrying overlay bias conductor not having the same dimensions as the sensor and not symmetrically positioned. This allows the effect of mismatching, for example due to faulty fabrication, to be predicted. The theoretical expressions are confirmed by experiment using a Hall probe. Various graphs are presented which show how the theory can be used in practical cases with typical sensor and conductor dimensions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.334883
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  • 8
    Electronic Resource
    Electronic Resource
    Asymmetrical magnetoimpedance in as-cast CoFeSiB amorphous wires due to ac bias (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 121-123 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Asymmetrical giant magnetoimpedance (AGMI), which utilizes a high frequency bias field hb, is realized in a Co-based amorphous wire having a circumferential anisotropy in the outer region. No asymmetry in the dc magnetic configuration is needed in this case. AGMI is discussed in terms of the surface impedance tensor, demonstrating that the effect of hb is related to the role of the off-diagonal component of the impedance in the voltage response measured across the wire. This effect is important for developing autobiased linear magnetic sensors. Using two oppositely biased wires, a near-linear voltage output (±4 mV) is obtained in the range of ±5 Oe for the sensed dc field at a frequency of 8 MHz. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126896
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  • 9
    Electronic Resource
    Electronic Resource
    Thickness and grain-size dependence of the coercivity in permalloy thin films : The 41st annual conference on magnetism and magnetic materials (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 4122-4124 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper reports the effect of thickness and grain size on the coercivity of Ni81Fe19 permalloy thin films (2.5–30 nm) sputtered on glass substrates for their application in magnetoresistive sensors. Coercivity was systematically investigated as a function of underlayer materials, thickness, and substrate temperature. Lateral grain size of the sputtered films was investigated. The grain size reduced very quickly in the thinner films. It was also found that the coercivity of the films with very small lateral grain size is much lower than those with a normal grain size. The lowest coercivity (Hc=0.8 Oe) was observed in 7.5 nm thick film and having a grain size of 4 nm. When an underlayer is used, its crystallinity affects the lateral grain size in the permalloy and correlates with the observed coercivity variation [P. Galtier, R. Jerome, and T. Valet, Mater. Res. Soc. Symp. Proc. 313, 417 (1993).] It was also observed that the coercivity of the permalloy is dependent on the nature of the underlayer. It was established that the coercivity of Ni81Fe19 films increases when the thickness increased from a critical film thickness and grain size. The variation of the coercivity in thin Ni81Fe19 films with lateral grain size and relationship with domain-wall width is discussed and compared with other theories for magnetization reversal. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365100
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  • 10
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    Surface impedance tensor in amorphous wires with helical anisotropy: Magnetic hysteresis and asymmetry (2001)
    American Institute of Physics
    Details
    Publication Date: 2001-06-01
    Print ISSN: 0021-8979
    Electronic ISSN: 1089-7550
    Topics: Physics
    Published by American Institute of Physics
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