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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Inorganic chemistry 17 (1978), S. 1831-1834 
    ISSN: 1520-510X
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Macromolecules 25 (1992), S. 4797-4806 
    ISSN: 1520-5835
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Algorithmica 18 (1997), S. 560-574 
    ISSN: 1432-0541
    Keywords: Key words. VLSI layout, Compaction, Graph constraints, Constraint graphs, Constraint reduction, Transitive reduction, Difference constraints.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science , Mathematics
    Notes: Abstract. The compaction problem in VLSI layout can be formulated as a linear program. To reduce the execution time and memory usage in compaction, it is important to reduce the size of the linear program. Since most constraints in compaction are derived directly or indirectly from physical separation and electrical connectivity requirements which can be expressed in the form of graph constraints, we study the graph constraint reduction problem. That is the problem of producing, for a given system of graph constraints, an equivalent system with the fewest graph constraints. After observing that the problem as previously formulated is NP-hard and overrestrictive in that the maximum possible reduction is not always attainable, we propose a new formulation in which the maximum possible reduction is guaranteed. We further present a polynomial-time algorithm for the new formulation.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Algorithmica 4 (1989), S. 263-291 
    ISSN: 1432-0541
    Keywords: VLSI circuit layout ; Floorplan design ; Simulated annealing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science , Mathematics
    Notes: Abstract In this paper we present two algorithms for the floorplan design problem. The algorithms are quite similar in spirit. They both use Polish expressions to represent floorplans and employ the search method of simulated annealing. The first algorithm is for the case where all modules are rectangular, and the second one is for the case where the modules are either rectangular or L-shaped. Our algorithms consider simultaneously the interconnection information as well as the area and shape information for the modules. Experimental results indicate that our algorithms perform well for many test problems.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Algorithmica 15 (1996), S. 550-571 
    ISSN: 1432-0541
    Keywords: Design automation ; VLSI layout ; Floorplanning ; Floorplan sizing ; Area minimization ; NP-complete ; Hierarchical floorplans ; Pseudopolynomial
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science , Mathematics
    Notes: Abstract In this paper we study the area-minimization problem for hierarchical floorplans. We settle an open problem on the complexity of the area-minimization problem for hierarchical floorplans by showing it to be NP-complete (even for balanced hierarchical floorplans). We then present a new algorithm for determining the nonredundant realizations of a wheel. The algorithm has time costO(k 2 logk) and space cost0(k 2) if each block in a wheel has at mostk realizations. Based on the new algorithm for a wheel, we design a new pseudopolynomial area-minimization algorithm for hierarchical floorplans of order-5. The time and space costs of the algorithm are0((nM)2log(nM) and0(n 2 M), respectively, wheren is the number of basic blocks andM is an upper bound on the dimensions of the realizations of the basic blocks. The area-minimization algorithm was implemented. Experimental results show that it is very fast.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 576 (1989), S. 0 
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 0162-0134
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Biology , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Ground water 34 (1996), S. 0 
    ISSN: 1745-6584
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Energy, Environment Protection, Nuclear Power Engineering , Geosciences
    Notes: The isotopic characteristics of municipal landfill leachate and gases (carbon dioxide and methane) are unique relative to the aqueous and gaseous media in most other natural geologic environments. The δ13C of the CO2 in landfills is significantly enriched in 13C, with values as high as +20 ‰ reported. The δ13C and δD values of the methane fall within a range of values representative of microbial methane produced primarily by the acetate-fermentation process. The δD of landfill leachate is strongly enriched in deuterium, by approximately 30 ‰ to nearly 60 ‰ relative to local average precipitation values. This deuterium enrichment is undoubtedly due to the extensive production of microbial methane within the limited reservoir of a landfill. The concentration of the radiogenic isotopes, 14C and 3H, are significantly elevated in both landfill leachate and methane. The 14C values range between approximately 120 and 170 pMC and can be explained by the input of organic material that was affected by the increased 14C content of atmospheric CO2 caused by atmospheric testing of nuclear devices. The tritium measured in leachate, however, is often too high to be explained by previous atmospheric levels and must come from material buried within the landfill. The unique isotopic characteristics observed in landfill leachates and gases provide a very useful technique for confirming whether contamination is from a municipal landfill or some other local source.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 3 (1996), S. 2203-2209 
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The transport dynamics of laser-ablated neutral/plasma plumes are of significant interest for film growth by pulsed-laser deposition of materials, since the magnitude and kinetic energy of the species arriving at the deposition substrate are key processing parameters. Dynamical calculations of plume propagation in vacuum and in background gas have been performed using particle-in-cell hydrodynamics, continuum gasdynamics, and scattering models. Results from these calculations are presented and compared with experimental observations. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 885-887 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ab initio calculations were performed to investigate adsorption and diffusion of C on the Si(001) surface at different surface and subsurface sites. Incorporation mechanisms of both substitutional and interstitial C during film deposition and growth were proposed. A surface diffusion process resulting in interstitial C incorporation was identified and the calculated energy barrier of ∼1.0 eV is consistent with the experimental value of 0.94±0.04 eV. The results support experimental observations of several groups: higher growth rates and lower temperatures favor the substitutional C incorporation. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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