Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
68 (1997), S. 2195-2199
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A modular differential interference contrast microscope combined with laser interferometry has been designed and constructed to detect nm-scale displacements of microscopic beads with a root mean square noise less than 0.4 nm. The unique feature of our system lies in its capability of preserving the nm-scale detection sensitivity down to a low-frequency region of a few Hz. The modularized design ensures the system is accessible to further modifications as frequently required by various biological experiments such as employing multiple laser traps to manipulate rod-shaped samples. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1148070
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