Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
74 (1999), S. 647-649
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
By measuring stress and strain that build up in thin films during hydrogen absorption, the elastic constants of the films can be determined, if a one-dimensional elastic behavior occurs only. This will be demonstrated for hydrogen absorption in Nb films. The in-plane stress is determined from the substrate curvature that is measured by using a two-beam laser setup. The out-of-plane strain is measured via x-ray diffraction. Furthermore, this method allows us to distinguish whether the film is plastically or elastically deformed by checking the reversibility of the stress–strain curve. In the case of a 250-nm-thick Nb film, the elastic constants obtained are similar to that of bulk Nb. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.123028
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