Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
67 (1990), S. 4152-4158
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Charge trapping in layered organic photoconductors consisting of a charge generation layer (CGL) and a charge transport layer (CTL) was studied by xerographic residual potential measurements. The residual potential builds up during repeated corona charging and light exposure cycles of photoconductors. The negative residual potential is proportional to the square of the CGL thickness and is linearly proportional to the CTL thickness. The square dependence is caused by the bulk trapping of electrons in the CGL, and the linear dependence is due to the negative charges on the CTL surface. From experimental results, it is concluded that the electron trapping in the CGL enhances the trapping of holes at the CGL/CTL interface, and consequently a fraction of negative corona charges remains on the CTL surface even after light exposure. The buildup of the residual potential during xerographic cycling is initiated by the electron trapping in the CGL. On the other hand, the decay rate of the residual potential after xerographic cycling depends on hole transport properties in the CTL. The activation energy for the decay of the residual potential is in good agreement with that for the drifting of holes through the CTL obtained from thermally stimulated current measurements. The decay rate of the residual potential is controlled by the surface charge neutralization process which involves the release of holes trapped at the CGL/CTL interface and the subsequent drifting of holes to the surface.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.344977
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