ISSN:
1573-4889
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract This paper describes some oxidation studies of evaporated aluminum films. Resistance marker measurements were carried out between 230 and 400° C and it was concluded that the oxide grows by metal transport. From the sign of its Seebeck coefficient, the oxide was deduced to ben-type. The effect of applying an electric field across the growing oxide layer on aluminum was also investigated. A porous platinum layer evaporated onto the oxide surface was used as one electrode, the underlying metal being the other electrode. At all temperatures between 50 and 400° C the same field effect was observed. When the oxygen-oxide interface was biased negative with respect to the aluminum, an enhancement of the oxidation rate was achieved. These results have been interpreted in terms of the Mott-Cabrera theory.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00604476
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