Publication Date:
2019-06-28
Description:
Component holder speeds examination of matched pairs. Transistors are oriented for two perpendicular x-ray views. Second view obtained by simply flipping block around corner near components, while corner remains in contact with film. Procedure allows inspection of up to 50 pairs - two views of each pair - on single x-ray film in same time previously required for 1 unmounted pair.
Keywords:
FABRICATION TECHNOLOGY
Type:
NPO-15675
,
NASA Tech Briefs (ISSN 0145-319X); 7; 4; P. 466
Format:
text
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