ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Secondary electron emission (SEE) characteristics, i.e., SEE yield maximum, the electron energy corresponding to the maximum yield, Emax, and crossover energies at which the SEE yield is unity, as a function of angle of incidence were determined for Kapton and Teflon. Photoelectron yield as a function of angle of incidence from Kapton were also determined. Secondary electron escape depth and photoelectron escape depth from Kapton were calcuated from the experimental data.Pulse beam techniques were used to reduce surface charging problems. Three μsec pulses of electrons were used in SEE experiments, and 100 msec to 1 sec pulses were used in photoemission experiments. The maximum yield of Kapton increases from 1.7 at normal incidence to 3.0 at 80° angle of incidence, Emax increases from 280 eV to 620 eV. The maximum yield of Teflon increases from 2.4 at normal incidence to 3.1 at 80° angle of incidence. The secondary electron escape depth in Kapton was calculated t be 55 ± 5 Å. Photoelectrons excited by 21 eV photons have a 87 ± 30 Å escape depth in Kapton.
Additional Material:
8 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740100210
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