ISSN:
1432-0630
Keywords:
61.16.Di
;
68.35.−p
;
73.30.+y
;
73.40.Ns
;
73.50.−h
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract Direct imaging with nanometer scale resolution of the Schottky barrier height and of the ballistic transmission of electrons through an ultrathin metal film is demonstrated for the first time. The images are obtained by applying a new pixel-by-pixel evaluation method to the ballistic electron emission spectroscopy (BEES). We find a laterally uniform Schottky barrier height φB=0.88 eV for ultrathin (3–22 nm) Au films evaporated on Si. The transmission coefficient is strongly correlated with the island structure of the Au film. A transmission decay length λ=14 nm is determined by a statistical analysis of the transmission coefficient with variation of the film thickness.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00351895
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