ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Integral area measurements of Auger intensities for various metal sulfides give comparable quantitative results to those obtained from derivative peak-to-peak heights. Highest precisions for sulfur sensitivity factors were obtained by: (a) intensity measurements involving integration of background-subtracted N(E) lineshapes, (b) matrix corrections for electron mean free path and backscattering factor, (c) the use of XPS-derived surface stoichiometries rather than assumed bulk stoichiometries for the metal sulfide standards. Despite the inherent inaccuracies of XPS quantitation, the XPS results help to correct for surface deviations from bulk stoichiometry owing to surface contamination, facile S surface oxidation, and preferential S loss usually observed during Ar+ sputter cleaning. The integral area Auger measurement techniques are particularly promising for electron-beam sensitive materials which often cannot be characterized using high primary electron doses and conventional energy-analyzer potential modulation differentiation.
Additional Material:
3 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740040505
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