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  • 1
    Monograph available for loan
    Monograph available for loan
    Cambridge : University Press
    Call number: M 99.0264
    Type of Medium: Monograph available for loan
    Pages: xvii, 563 S.
    Edition: 2. Aufl.
    ISBN: 0521629225
    Classification:
    Petrophysics
    Location: Upper compact magazine
    Branch Library: GFZ Library
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 4866-4873 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In the early stage of growth of a metal film on a substrate by the Volmer–Weber mechanism, a tensile stress in the film is observed to arise at about the point in the process when islands of deposited material begin to coalesce. The mechanism commonly proposed as the origin of this tensile stress is that the coalescing islands deform in order to form a relatively low energy grain boundary, at the expense of some surface energy by surface area reduction, and that this proceeds until a stress is generated that has magnitude sufficient to prevent further area reduction. Several models have been proposed for this process, but the inferred tensile stress estimates have been much larger than observed stress magnitudes in many cases. The purpose here is to introduce a model for the process based on the theory of contact of elastic solids with cohesion. A description of the process is developed on this premise for one-dimensional, two-dimensional, and three-dimensional states of deformation of coalescing islands. It is found that the latter case leads to an estimate of film stress generally consistent with observations. The features of the model for different dimensionalities are compared and contrasted with each other, as well as with other models which have been proposed for this process. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 37-45 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used picosecond ultrasonics techniques to study the vibrations of several nanostructures composed of laterally patterned gold films on fused quartz substrates. The structures include arrays of stripes and dots with lateral repeat distance as small as 2000 A(ring). The frequencies and attenuation rates of the low-lying normal modes of these structures are measured. We compare these results with those obtained theoretically from a finite element analysis of the dynamics of the structures, and discuss the physical nature of the principal vibrational modes.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 6081-6090 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A combined analytical and computational model is developed to study the mechanics of strained epitaxial island growth in typical semiconductor systems. Under certain growth conditions in systems with a film/substrate lattice mismatch, deposited material is known to aggregate into islandlike shapes with geometries having arc shaped cross-sections. A two-dimensional model assuming linear elastic behavior is used to analyze an isolated arc shaped island with elastic properties similar to those of the substrate. The substrate is assumed to be much larger than the island. Finite element analysis shows that in order to minimize the total energy, which consists of strain energy, surface energy, and film/substrate interface energy, a coherent island will adopt a particular height-to-width aspect ratio that is a function of only the island volume. It is then shown that for an island with volume greater than a certain critical size, the inclusion of a mismatch strain relieving edge dislocation is favorable. The criterion for the critical size is based on a comparison of the configurational forces acting on the edge of the island in the presence of an edge dislocation. Finally, a finite element calculation combined with an analytical treatment of the singular dislocation fields is used to determine the minimum energy island aspect ratio for the dislocated island/substrate system. The combination of the minimum energy morphology studies for the coherent and dislocated systems with the dislocation nucleation criterion gives a complete model for strained epitaxial island growth which can serve as a basis for interpretation of experiments. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 3855-3868 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Simple theoretical models have been used to investigate four possible mechanisms of void growth in interconnect lines with a bamboo grain structure. The mechanisms considered are: creep deformation by dislocation motion; grain-boundary diffusion; diffusion along the interface between the line and the surrounding passivation; and void growth by lattice diffusion. The results show that all four mechanisms may cause the void to grow, but any one mechanism operating alone gives rise to slow or negligible rates of growth; however, plastic creep flow and grain-boundary diffusion may act in a cooperative manner, which causes rapid void growth. It is shown that the extent of coupling between diffusion and creep increases as the linewidth is reduced. Finally, the numerical calculations are used to estimate the time required for the line to fail, as a function of temperature and linewidth. The predictions are shown to be consistent with observations reported in the literature.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7280-7287 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The residual strain following relaxation in a variety of Si1−xGex heteroepitaxial films grown on (001) Si wafers has been compared with the values of residual strain predicted by the theory based on the incremental movements of isolated threading dislocation segments. It is found that for very thin films (40–500 nm) the measured residual strains after relaxation are significantly higher than the values predicted by this theory. For thicker films, the residual strains are very close to the predicted values. The effect of the interactions of parallel dislocations on the residual strain are investigated using the model developed by Willis, Jain, and Bullough [Philos. Mag. A 62, 115 (1990)] for a two-dimensional array of dislocations. It is found that the experimental data cannot be explained by this model since it predicts even lower values of residual strain than the model based on isolated threading segments. The residual strains are also compared with predictions based on Freund's treatment of the blocking of a moving threading segment by an orthogonal misfit dislocation present in its path [J. Appl. Phys. 68, 2073 (1990)]. It is found that Freund's blocking criterion gives a very good account of the residual strain in Si1−xGex films. Blocking of threading dislocations by other misfit dislocations appears to play an important role in the late stage of strain relaxation in these structures and thus may limit the possibility of obtaining fully relaxed films with low threading dislocation densities. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 2054-2056 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The concept of excess stress was originally introduced in a study of elastic strain relaxation in an epitaxial layer grown beyond its critical thickness, where it was proposed as the relevant stress in a kinetic law for dislocation motion. The concept has subsequently been applied in a variety of studies of strain relaxation, but without a standard definition as a basis for quantitative comparisons. The purpose here is to propose a fundamental definition of excess stress as the particular stress measure which is work-conjugate to the Burgers displacement during glide of a threading dislocation in a strained layer. This definition also has the feature of being consistent with definitions of effective stress in kinetic laws of glide in bulk materials.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 2073-2080 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In a strained layer grown epitaxially on a substrate, the motion of a dislocation on any particular glide plane in the layer can be influenced by the presence of dislocations on other glide planes. The focus here is on the glide of a dislocation extending from the free surface of the layer to the layer-substrate interface, the so-called threading dislocation. A general definition of driving force for glide of a threading dislocation in a nonuniform stress field is adopted to calculate the driving force on a threading dislocation due to an encounter with an interface misfit dislocation on an intersecting glide plane. The result is examined in detail for the case of cubic materials, taking into account different combinations of Burgers vectors. The analysis makes it clear that the misfit dislocation forces the threading dislocation to glide through a channel of width less than the full layer thickness. A blocking criterion is proposed, based on the presumption that blocking will occur if the channel width is less than the critical thickness for the local reduced strain. The results indicate that this effect can be significant in blocking the glide of a threading dislocation, depending on the mismatch strain magnitude and the layer thickness.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 3714-3725 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Lattice mismatch in epitaxial layered heterostructures with small characteristic lengths induces large, spatially nonuniform strains. The components of the strain tensor have been shown experimentally to affect the electronic properties of semiconductor structures. Here, a technique is presented for calculating the influence of strain on electronic properties. First, the linear elastic strain in a quantum dot or wire is determined by a finite element calculation. A strain-induced potential field that shifts and couples the valence subbands in the structure is then determined from deformation potential theory. The time-independent Schrödinger equation, including the nonuniform strain-induced potential and a potential due to the heterostructure layers, is then solved, also by means of the finite element method. The solution consists of the wave functions and energies of states confined to the active region of the structure; these are the features which govern the electronic and transport properties of devices. As examples, two SixGe1−x submicron resonant tunneling devices, a quantum wire with two-dimensional confinement and a quantum dot with three-dimensional confinement, are analyzed. Experimentally measured resonant tunneling current peaks corresponding to the valence subbands in the material are modeled by generating densities of confined states in the structures. Size and composition-dependent strain effects are examined for both devices. In both the quantum dot and the quantum wire, the strain effects on the wave functions and energies of confined states are evident in the calculated densities of confined states in the structures, which are found to be consistent with experimentally measured tunneling current/voltage curves for resonant tunneling diodes. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 81 (2002), S. 364-366 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report on calculations of the formation energies of several [100] and [110] oriented step structures on biaxially stressed Si and Ge (001) surfaces. It is shown that a novel rebonded [100] oriented single-height step is strongly stabilized by compressive strain compared to most well-known step structures. We propose that the side walls of "hut"-shaped quantum dots observed in recent experiments on SiGe/Si films are made up of these steps. Our calculations provide an explanation for the nucleationless growth of shallow mounds, with steps along the [100] and [110] directions in low- and high-misfit films, respectively, and for the stability of the (105) facets under compressive strain. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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