Publication Date:
2016-04-20
Description:
We measure basic network parameters of silver nanowire (AgNW) networks commonly used as transparent conducting electrodes in organic optoelectronic devices. By means of four point probing with nanoprobes, the wire-to-wire junction resistance and the resistance of single nanowires are measured. The resistance R NW of a single nanowire shows a value of R NW = ( 4.96 ± 0.18 ) Ω / μ m . The junction resistance R J differs for annealed and non-annealed NW networks, exhibiting values of R J = ( 25.2 ± 1.9 ) Ω (annealed) and R J = ( 529 ± 239 ) Ω (non-annealed), respectively. Our simulation achieves a good agreement between the measured network parameters and the sheet resistance R S of the entire network. Extrapolating R J to zero, our study show that we are close to the electrical limit of the conductivity of our AgNW system: We obtain a possible R S reduction by only ≈ 20 % (common R S ≈ 10 Ω / sq ). Therefore, we expect further performance improvements in AgNW systems mainly by increasing NW length or by utilizing novel network geometries.
Print ISSN:
0003-6951
Electronic ISSN:
1077-3118
Topics:
Physics
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