ISSN:
1013-9826
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Colloidal probe atomic force microscopy is a very useful tool in the study of colloidalinteractions. Although this technique has been applied to study interactions between a particle and apolarized electrode during electrodeposition, it has never been used to study interactions in highelectric fields as encountered in electrophoretic deposition. In this work, a preliminary study wasundertaken to verify whether colloidal probe AFM could be used to measure the electrophoreticforce on a particle. It was found that the electrophoretic force could be detected by colloidal probeAFM under certain circumstances. In order to prevent that the contribution of the cantilever on themeasurement of the electrophoretic force becomes large, the charge on the cantilever should besmall compared to the charge of the particle, which is attached to the cantilever. Moreover, the areaof cantilever surface which is oriented parallel to the electric field should be small to minimize thecontribution of the cantilever
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/51/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.314.1.pdf
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