Publication Date:
2019-07-13
Description:
We present radiation data, Total Ionizing Dose and Single Event Effects, on the LSI Logic 0.11 micron commercial process and two modified versions of this process. Modified versions include a buried layer to guarantee Single Event Latchup immunity.
Keywords:
Electronics and Electrical Engineering
Type:
2006 Nuclear and Space Radiation Effects Conference (NSREC); Jul 17, 2006 - Jul 21, 2006; Ponte Verdra, Fl; United States
Format:
application/pdf
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