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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 1884-1886 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electron energy-loss spectroscopy was used to monitor structural damage to solid C60 as a function of electron exposure. The characteristic dose was found to be in the range 300–700 C/cm2 for incident energies in the range 100–200 keV and specimen temperatures between 100 and 300 K. The absolute value of this dose, and its energy and temperature dependence, suggest that the damage mechanism is predominantly electronic rather than knock-on displacement. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 2272-2277 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A simple process for improving texture and electrical mobility of polycrystalline films is described. The technique involves annealing the film in a controlled temperature gradient and produces chainlike structures of impurity-free grains; dopants and other defects are confined to grain boundaries. The diffusion of impurities, as well as self-diffusion of the host lattice, produces a combing effect and causes grain reorientation in the annealed films. The electrical sheet conductance increases with increasing temperature gradient but attains an optimum value, above which the conductance falls due to microcracking of the film. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    ISSN: 0741-0581
    Keywords: Electron energy loss spectroscopy ; Parallel detection ; Photodiode assays ; Fluorescent screens ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: The present report paper deals with the use of a photodiode array for recording electron energy loss spectra in a transmission electron microscope. Important properties of the array are outlined, together with a description of the circuitry needed for interfacing the output to a multichannel analyser.In the direct-exposure mode, the device can easily detect a single (80 or 100 keV) electron, allowing inner-shell energy losses between 200 eV and 2000 eV to be recorded in about 10 seconds. By signal averaging a large number of readouts, a dynamic range of at least 105 is possible. Irradiation damage to the array can be controlled by cooling the array and by various anealing procedures. Sensitivity and DQE are lower, but the dynamic range is higher in the indirect mode, where a fluorescent screen is used to convert the electrons into visible photons, which are then imaged onto the diodes. The choice of screen material and of optical coupling to the array are discussed. Several spectral artifacts are described, together with spectrum-processing techniques designed to remove them.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    ISSN: 0741-0581
    Keywords: Thickness measurement ; Electron energy-loss spectroscopy (EELS) ; Inelastic mean free path ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: We discuss measurement of the local thickness t of a transmission microscope specimen from the log-ratio formula t = λ In (It/I0) where It and I0 are the total and zero-loss areas under the electron-energy loss spectrum. We have measured the total inelastic mean free path λ in 11 materials of varying atomic number Z and have parameterized the results in the form λ = 106F (E0/Em)/ln (2βE0/Em) where F = (1 + E0/1,022)/(1 + E0/511)2, the incident energy E0 is in keV, the spectrum collection semiangle β is in mrad, and Em = 7.6Z0.36. This formulation should allow absolute thickness to be determined to an accuracy of ±20% in most inorganic specimens.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Materials scientists have struggled for a while to find a process which can be used to engineer individual grain boundaries separating two adjacent grains. Considerable effort has also been devoted to finding a technique that can control the orientation of individual grains. A temperature gradient applied during the chemical vapor deposition of thin copper films provides an effect such that chains of grains oriented in the same direction are produced at chosen positions in the film. As a result of an interaction between defect migration and crystal growth, interconnected grains, oriented in the 〈110〉 direction and separated by twin grain boundaries, form chains along contours of equal temperature. When the temperature gradient is small, low-angle tilt boundaries, low-energy coincidence-site boundaries, and twin boundaries are observed. For a sharp temperature gradient, all boundaries are coherent twin boundaries. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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