ISSN:
1063-7826
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract An internal friction method is proposed for investigating the kinetics of impurity deposits on grain surfaces in polycrystalline samples. The possibilities of the method have been tested on polycrystalline, gas-sensitive, tellurium-doped layers of tin dioxide.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1134/1.1187074
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