Publication Date:
2019-07-13
Description:
The purpose of this presentation is to discuss the COTS performance, clock upset / single event transient, device configuration upset, antifuse hardening, heavy ion SEU, total dose, proton sensitivities, latchup, and additional information and data.
Keywords:
Computer Programming and Software
Type:
Jul 01, 1998; Newport Beach, CA; United States
Format:
text
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