ISSN:
1432-0630
Keywords:
73
;
85.30
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract An attempt is made to investigate the effect of a quantizing magnetic field on the capacitance of MOS structures of small-gap semiconductors havingn-channel inversion layers under the weak electric-field limit. It is found, takingn-channel InSb as an example, that both the MOS and surface capacitances show spiky oscillations with changing magnetic field. It is further observed that the sharpness and the depths of the spikes increase with increasing magnetic field whereas the depths are found to decrease with increasing thickness of the insulating layer.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00885997
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