ISSN:
1572-817X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00430338
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