Publication Date:
2015-02-03
Description:
X-ray photoelectron diffraction (XPD) in combination with hard X-ray photoelectron spectroscopy (HAXPES) has been used to study the structure of buried layers in thin multilayer films. A detailed layer-by-layer investigation was performed using the element-specific, local-probe character of XPD. In the present work, angular-resolved HAXPES at a photon energy of 7.94 keV photon energy was used to investigate a Cr/Mn 62 Ga 38 /Mg/MgO multilayer system. Differences in the angular distributions of electrons emitted from Mn and Ga atoms revealed that the structure of Mn 62 Ga 38 changes from L 1 0 towards D 0 22 for increasing annealing temperatures. A c / a ratio of 1.81 ± 0.06 was determined for the buried Mn 62 Ga 38 layer in a D 0 22 structure from the XPD experiment. The improvement of the structural order of the Mn 62 Ga 38 layer is accompanied by an improvement of the structure of the overlying MgO layer.
Print ISSN:
0003-6951
Electronic ISSN:
1077-3118
Topics:
Physics
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