ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A negative ion sputter source incorporating a microbeam Cs+ source intended for application in accelerator mass spectrometry (AMS) has been developed from a General Ionex HICONEX 834™ source. (HICONEX is a trade mark of High Voltage Engineering Europa.) The source is part of a microbeam AMS system, designed for in situ microanalysis of geological samples known as AUSTRALIS (AMS for UltraSensitive TRAce eLement and Isotopic Studies) recently developed at the Heavy Ion Analytical Facility laboratory. With requirements of precise beam positioning on mineralogical samples, a high magnification sample viewing system is a vital part of the source, enabling live observation of the sputtering process and visual tuning of the primary beam. Microbeam of Cs+ of 30 μm in diameter can be produced routinely with adequate intensity for a number of applications. The "screen" electrode in the secondary ion extraction system facilitates steering of the primary beam affected by the extraction field, back into the geometric center of the sample. The injector system includes high resolution electric and magnetic analyzers, improving the background suppression before injection into the accelerator. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1148747
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