AIP Digital Archive
Electrical Engineering, Measurement and Control Technology
A wide variety of x-ray and extreme ultraviolet (EUV) diagnostics are being developed to study z-pinch plasmas at the Nevada Terawatt Facility at the University of Nevada, Reno. Time-resolved x-ray/EUV imaging and spectroscopy, x-ray polarization spectroscopy, and backlighting will be employed to measure profiles of plasma temperature, density, flow, and charge state, and to investigate electron distribution functions and magnetic fields. The instruments are state-of-the-art applications of glass capillary converters (GCC), multilayer mirrors (MLM), and crystals. New devices include: a novel GCC-based two-dimensional imaging spectrometer, a six-channel crystal/MLM spectrometer ("polychromator") with a transmission grating spectrometer, and two sets of x-ray/EUV polarimeters/spectrometers. An x-pinch backlighter is under development. X-ray polarimeter/spectrometer, a survey spectrometer, a multichannel time-gated x-ray pinhole camera, and filtered fast x-ray diodes have observed the structure of Ti and Fe x pinches driven by a 0.9 MA current. X-ray yield and pulse duration depend sensitively on the wire load. © 2001 American Institute of Physics.
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