Electronic Resource
Chester
:
International Union of Crystallography (IUCr)
Journal of synchrotron radiation
5 (1998), S. 1032-1034
ISSN:
1600-5775
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
To evaluate the application of the conversion-electron-yield (CEY) method in catalyst analysis, the intensities of the CEY and X-ray fluorescence (XRF) as a function of glancing angle were measured simultaneously. The probing depth of the CEY method is shallower than that of the XRF method. The CEY method also shows potential application for the analysis of even a powder specimen of a low-concentration zeolite catalyst.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0909049597019031
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